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Optical triggering of 12 kV, 100 A 4H-SiC thyristorsRUMYANTSEV, S. L; LEVINSHTEIN, M. E; SHUR, M. S et al.Semiconductor science and technology. 2012, Vol 27, Num 1, issn 0268-1242, 015012.1-015012.4Article

Evaluation of the generation mechanisms at surface and in the bulk of the silicon by current transient techniqueBARLETTA, Giacomo; CURRO, Giuseppe.Microelectronics and reliability. 2007, Vol 47, Num 4-5, pp 810-814, issn 0026-2714, 5 p.Conference Paper

Interface states and traps in thin N2O-grown oxynitride/oxide di-layer for PowerMOSFET devicesCURRO, Giuseppe; CAMALLERI, Marco; CALL, Denise et al.Microelectronics and reliability. 2007, Vol 47, Num 4-5, pp 819-821, issn 0026-2714, 3 p.Conference Paper

A simulation study on novel field stop IGBTs using superjunctionOH, Kwang-Hoon; LEE, Jaegil; LEE, Kyu-Hyun et al.I.E.E.E. transactions on electron devices. 2006, Vol 53, Num 4, pp 884-890, issn 0018-9383, 7 p.Article

SiGe-collector trench gate insulated gate bipolar transistor fabricated using multiple target sputteringKUDOH, Tsugutomo; ASANO, Tanemasa.Solid-state electronics. 2005, Vol 49, Num 12, pp 2006-2010, issn 0038-1101, 5 p.Article

A 2D physically based compact model for advanced power bipolar devicesIGIC, P. M; TOWERS, M. S; MAWBY, P. A et al.Microelectronics journal. 2004, Vol 35, Num 7, pp 591-594, issn 0959-8324, 4 p.Article

Computer simulation of multifinger heterojunction bipolar transistor with self-heating and thermal coupling modelsKUEN YU HUANG; YIMING LI; LEE, C.-P et al.Microelectronic engineering. 2004, Vol 75, Num 2, pp 137-144, issn 0167-9317, 8 p.Article

3.6 mΩ cm2, 1726 V 4H-SiC normally-off trenched-and-implanted vertical JFETs and circuit applicationsZHAO, J. H; TONE, K; LI, X et al.IEE proceedings. Circuits, devices and systems. 2004, Vol 151, Num 3, pp 231-237, issn 1350-2409, 7 p.Conference Paper

1.7 kV NPTV-groove clustered IGBTSPULBER, O; SWEET, M; VERSHININ, K et al.IEE proceedings. Circuits, devices and systems. 2004, Vol 151, Num 3, pp 265-268, issn 1350-2409, 4 p.Conference Paper

Fast recovery diodes - : Reverse recovery behaviour and dynamic avalancheLUTZ, Josef.International conference on microelectronics. 2004, isbn 0-7803-8166-1, 2Vol, vol 1, 11-16Conference Paper

Application of carrier lifetime control by irradiation to 1.2kV NPT IGBTsSIEMIENIEC, Ralf; HERZER, Reinhard; NETZEL, Mario et al.International conference on microelectronics. 2004, isbn 0-7803-8166-1, 2Vol, vol 1, 167-170Conference Paper

Analysis of mechanism for transparent emitterCAILIN, Wang; GAO YONG.International Semiconductor Conference. 2004, pp 359-362, isbn 0-7803-8499-7, 4 p.Conference Paper

Filamentation and Blow-up Ignition in p-n-p-n DevicesPAISANA, J; SANTOS, H. Abreu.Mediterranean electrotechnical conference. 2004, isbn 0-7803-8271-4, 3Vol, Vol.1, 47-50Conference Paper

Current state-of-the-art and future prospects for power semiconductor devices in power transmission and distribution applicationsJOHNSON, C. Mark.International journal of electronics. 2003, Vol 90, Num 11-12, pp 667-693, issn 0020-7217, 27 p.Article

Commande des semi-conducteurs de puissance : principes = Control of power semiconductor devices : principlesLEFEBVRE, Stéphane; MULTON, Bernard.Techniques de l'ingénieur. Génie électrique. 2002, Vol D5, Num D3231, pp D3231.1-D3231.23, issn 0992-5449Article

Feasibility study of 25 V SiGe RF-power transistors for cellular base station output amplifiersJOHANSSON, Ted; NI, Wei-Xin.Materials science & engineering. B, Solid-state materials for advanced technology. 2002, Vol 89, Num 1-3, pp 88-92, issn 0921-5107Conference Paper

Future navy application of wide bandgap power semiconductor devicesERICSEN, Terry.Proceedings of the IEEE. 2002, Vol 90, Num 6, pp 1077-1082, issn 0018-9219Article

Lateral Schottky rectifiers for power integrated circuitsJAGADESH KUMAR, M; SINGH, Yashvir.SPIE proceedings series. 2002, pp 414-421, isbn 0-8194-4500-2, 2VolConference Paper

Study of hot-spot phenomena in cellular power transistors by analytical electro-thermal simulationBAGNOLI, Paolo Emilio; DI PASCOLI, Stefano; BREGLIO, Giovanni et al.ESSCIRC 2002 : European solid-state circuits conferenceEuropean solid-state device research conference. 2002, pp 547-550, isbn 88-900847-8-2, 4 p.Conference Paper

A semi-theoretical relationship between the breakdown voltage of field plate edge and field plate design in planar P-N junction terminated with finite field plateJIN HE; XING ZHANG.Microelectronics journal. 2001, Vol 32, Num 9, pp 763-767, issn 0959-8324Article

Development of 66 kV-class high-Tc superconducting power transmission cable: remarkable decrease in AC losses and production of prototype cableMIYOSHI, K; MUKOYAMA, S; TSUBOUCHI, H et al.Physica. C. Superconductivity and its applications. 2001, Vol 357-60, pp 1259-1262, 2Conference Paper

4.5kV-2000A Power Pack IGBT (Ultra High Power Flat-Packaged PT type RC-IGBT)FUJII, Takeshi; YOSHIKAWA, Koh; KOGA, Takeharu et al.ISPO'2000 : international symposium on power semiconductor devices and IC's. 2000, pp 33-36, isbn 0-7803-6269-1Conference Paper

6.5 kV Ultra soft & fast recovery diode (U-SFD) with high reverse recovery capabilityMORI, Mutsuhiro; KOBAYASHI, Hideo; YASUDA, Yasumichi et al.ISPO'2000 : international symposium on power semiconductor devices and IC's. 2000, pp 115-118, isbn 0-7803-6269-1Conference Paper

Progress in wide bandgap semiconductor SiC for power devicesMATSUNAMI, Hiroyuki.ISPO'2000 : international symposium on power semiconductor devices and IC's. 2000, pp 3-9, isbn 0-7803-6269-1Conference Paper

Modélisation et simulation électrothermique en electronique de puissance = Power electronics : modelisation and electrothermal simulationGLAO, D. S; DURASTANTI, J. F; TORTEL, V et al.Colloque annuel - SFT. 2000, pp 771-776, issn 1258-164X, isbn 2-84299-200-8Conference Paper

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